LD12–Modeling Impact of Oxide Island on the Lasing of ARROW-VCSEL
We analyze the impact of a low-refractive antiresonant oxide island buried in a top VCSEL mirror on the lasing conditions of lateral modes of different orders. By performing comprehensive thermal, electrical, and optical numerical analysis of the VCSEL device, we show the impact of the size and location of the oxide island on the current crowding effect and compute threshold currents for various lateral modes. We demonstrate that if the island is placed close to the cavity, the threshold shows strong oscillations, which for moderate island distances can be tuned to increase the side mode discrimination.
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